PCI-5152
May 16, 2026

PCI-5152

I. Basic Information Model: PCI-5152 Brand: National Instruments NI Part Number: 778951-01 (varies by memory configuration) Product Type: 2-channel high-speed digitizer, oscilloscope card Bus: PCI, 32-bit Channel Count: 2 analog inputs, synchronous sampling Resolution: 8 bits Real-time Sampling Rate: 2 GS/s per channel Equivalent Sampling ETS: Up to 20 GS/s Analog Bandwidth: DC to 300 MHz Onboard Memory: 8 MB per channel, up to 256 MB Product Status: Out of Production Alternative Model: PXIe-5152 Features: Ultra-high-speed sampling, wide bandwidth, deep memory, nanosecond-level capture

Description

I. Basic Information

Model: PCI-5152

Brand: National Instruments NI

Part Number: 778951-01 (varies by memory configuration)

Product Type: 2-channel high-speed digitizer, oscilloscope card

Bus: PCI, 32-bit

Channel Count: 2 analog inputs, synchronous sampling

Resolution: 8 bits

Real-time Sampling Rate: 2 GS/s per channel

Equivalent Sampling ETS: Up to 20 GS/s

Analog Bandwidth: DC to 300 MHz

Onboard Memory: 8 MB per channel, up to 256 MB

Product Status: Out of Production

Alternative Model: PXIe-5152

Features: Ultra-high-speed sampling, wide bandwidth, deep memory, nanosecond-level capture

II. Application Scenarios

Ultra-high-speed signal acquisition, nanosecond pulse measurement, transient signal capture

Semiconductor testing, high-speed digital circuits, signal integrity analysis

RF intermediate frequency testing, dynamic signals within 300 MHz

Laser pulses, radar signals, ultrasonic detection

Consumer electronics, aerospace, defense research, medical equipment

Automated test system, high-speed waveform recording, abnormal event capture

III. Analog Input Specifications

Channel configuration: 2 channels of synchronous sampling, single-ended BNC

Sampling resolution: 8-bit Flash ADC

Real-time sampling rate: 2 GS/s per channel

ETS equivalent sampling: 20 GS/s for repetitive signals

Analog bandwidth: DC to 300 MHz

Input coupling: AC/DC programmable

Input impedance: Software selectable: 50Ω or 1MΩ

Input range: ±100mV, ±1V, ±5V, ±10V

Input connector: BNC

Typical noise value: 1.5 mVrms at 50Ω

IV. Memory and Data Transmission

On-board memory: 8 MB per channel, 32 MB, 128 MB, 256 MB

Maximum record length depends on memory configuration

Transmission mode: PCI bus master control, DMA, real-time stream disk

Data format: 8-bit binary complement code

V. Trigger and Synchronization

Trigger source: Internal channel, external BNC

Trigger mode: edge, level, window, pulse width, video, delay

Trigger range: programmable threshold

External clock: 1 channel SMB reference clock input

Synchronization bus: supports RTSI multi-card synchronization

Output signal: trigger output, event output, SMB

VI. Physical and Electrical Specifications

Board card specifications: standard PCI half-length card

Interface panel: 2 channels of BNC input, 1 channel of BNC trigger, 1 channel of SMB clock

Power supply: PCI slot power supply +5V, +3.3V

Operating temperature: 0 to 55 degrees Celsius

Operating humidity: 10% to 90% without condensation

Weight: approximately 300 grams

VII. Software Compatibility

Driver: NI-Scope, NI-DAQmx

Development environment: LabVIEW, LabWindowsCVI, C#, C++

Operating system: Windows XP, 7, 10, 11 (32/64-bit)

Supporting tools: Spectrum measurement, waveform analysis, over 50 measurement functions

Software panel: Virtual oscilloscope, no programming required

VIII. Core Features

2 channels, 8 bits, 2GS/s synchronous acquisition, 300 MHz bandwidth

ETS equivalent sampling: 20GS/s for capturing high-frequency repetitive signals

Deep memory: maximum 256MB per channel, long waveform recording

Software selectable: 50Ω, 1MΩ impedance, compatible with RF and general systems

Multiple trigger modes: pulse width trigger, stable capture of complex waveforms

RTSI multi-card synchronization: expand channels to dozens

BNC interface plug-and-play, suitable for high-speed and mass production testing

Nanosecond-level rising edge capture, suitable for semiconductor and high-speed digital testing

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